LTETest card, 4G test card, lte-fdd card, lte-tdd card, GSM test card, CDMA test card, UIM test card, ruim test card, WCDMA mobile phone test card, TD-SCDMA test card, CDMA2000 test card, mobile phone test card (also known as white card), signal test used in communication industry production (LTE (long term evolution) is the long-term evolution of UMTS technical standards formulated by 3GPP organization, It was officially approved and launched at the 3GPP TSG ran#26 meeting in Toronto in December 2004. The LTE system introduces key transmission technologies such as OFDM and multi antenna MIMO, which significantly increases the spectral efficiency and data transmission rate (the peak rate can reach uplink 50mbit/s and downlink 100mbit/s), and supports a variety of bandwidth allocation: 1.4mhz, 3MHz, 5MHz, 10MHz, 15MHz and 20MHz. The spectrum allocation is more flexible, and the system capacity and coverage are significantly improved. LTE wireless network architecture is more flat, which reduces the system delay, network construction cost and maintenance cost. The LTE system supports interoperability with other 3GPP systems. Fdd-lte has become the 4G standard with the widest range of countries and regions and the richest variety of terminals in the world.). It is commonly used in LTE mobile phones, 4G mobile phones, FDD mobile phones, GSM mobile phones, UIM mobile phones, ruim mobile phones, CDMA2000 mobile phones, and carries out non-interference comprehensive tests on mobile phones with the help of comprehensive testers and self built networks; In the production of mobile phones, we need to test the relevant signals of the finished products, but we need to carry out large-scale screening, which requires more human and material resources and testing time, making the production process complicated and the cost increased. The test card can realize the only path from the signal to the instrument to the mobile phone, making the test environment more concise and solving this complicated problem well. The test card can be used for coupling test, bit error rate test, complete VCC and rstb, and can be used for terminal and integrated tester test, etc